Technical information
- Bruker D8 Discover X-ray diffration system (XRD)
- Cu K-alpha radiation (1.5406 Å)
- Trio primary optics
- Eulerian cradle with 4" wafer holder
- PathFinder detector (variable slit and Ge(220) analyzer crystal)
- Scans: 2T/T, reflectivity, GIXRD, rocking curve, RSM
Tool Overview
Responsible: Peter Blomqvist
Location: Room Q117/118
License and Booking Required: Yes
Main application: crystallographic and surface/interface characterization
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