Technical information
- Bruker Icon Atomic Force Microscope (AFM)
- Scan modes:
- Tapping & contact mode
- PeakForce tapping
- PeakForce QNM
Tool Overview
Responsible: Peter Blomqvist & David Alcer
Location: Room Q117/118
License and Booking Required: Yes
Main application: surface topography, nanomechanical & electrical measurements
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