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Technical information
  • Alpha SE variable angle spectroscopic ellipsometer
  • Wavelength range: 390 - 900 nm
  • Angles: 65, 70, 75 deg
  • Max sample size: 6" diameter
Tool Overview

Responsible:  Sarah McKibbin~ftf-pbo 

Location: Level 1 - Q161 UVL lab

License and Booking Required: Yes

Main application: thin film characterization (film thickness, surface/interface & optical properties)

Documentation

User Manuals

Staff Documents

Process - Sample Models

Examples - Woollam RC2

Other Links

Safety Information

View on LIMS

FAQ

User Discussion Forum




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