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Lund Nano Lab
Metrology / Characterisation
Profiler - Bruker DektakXT
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Created by
Peter Blomqvist
, last updated on
2021 Feb 01
1 minute read
Line scan - information about topography and surface roughness
Map scan - information about topography and surface roughness
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{"serverDuration": 94, "requestCorrelationId": "77e324fddee65543"}