Technical information
- Hitachi SU8010 Scanning Electron Microscope (SEM)
- Cold field emission gun
- Detectors: In-lens SE & E-T SE, STEM
- In-situ EBIC & I-V measurements
Tool Overview
Responsible: ~ftf-pbo & Alexander den Ouden
Location: Room Q260, (Level 2)
License and Booking Required: Yes
Documentation