Technical information
- Bruker Icon Atomic Force Microscope (AFM)
Scan modes:
Tapping & contact mode
PeakForce tapping
PeakForce QNM
PF-TUNA, SCM, KPFM, MFM, EFM and PFM
Tool Overview
Responsible: ~ftf-pbo & Sarah McKibbin
Location: Room Q161, (Level 1 - UVL Lab)
License and Booking Required: Yes
Main application: surface topography, nanomechanical & electrical measurements
Documentation