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Technical information
  • Bruker Icon Atomic Force Microscope (AFM)
  • Scan modes:

    • Tapping & contact mode

    • PeakForce tapping

    • PeakForce QNM

    • PF-TUNA, SCM, KPFM, MFM, EFM and PFM

Tool Overview

Responsible: Peter BlomqvistSarah McKibbin

Location: Room Q161, (Level 1 - UVL Lab)

License and Booking Required: Yes

Main application: Surface topography, mechanical & electrical properties





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