You are viewing an old version of this page. View the current version.

Compare with Current View Page History

« Previous Version 8 Next »






Tool Summary

  • Tool Responsible: Dmitry Suyatin

  • Location:  Q158 (Level 1 - EVA room)

  • License Required: Yes

  • Booking Compulsory: Yes

  • Tool Information:

Table-top Reactive Ion Etching (RIE) system Sirus T2 Plus from Trion Technology. The system is designed for etching Si, SiO2, Si3N4, W, Mo and polymers (resists) with fluorine-based chemistry. Unprotected surfaces of the following materials are not allowed: glasses, noble metals (Au, Ag, Pt, Cu, Pd), heavy metals (Cd, Pb, Zn) and certain types of polymers (e.g. silicones). In total, 5 gases available: CF4, CHF3, SF6, O2 and Ar. Up to 8 inch wafer substrate size. No wafer clamping. Room temperature processing. Plasma excitation: RF (13.56 MHz, up to 600W). Process pressure down to 10 mTorr. The system is equipped with Intellevation LEP400 laser interferometric etch depth monitor and end point detector.

Safety

User Manuals

Process

Staff Documents


     View on LIMS

    




  • No labels