Technical information
- Bruker Icon Atomic Force Microscope (AFM)
Scan modes:
Tapping & contact mode
PeakForce tapping
PeakForce QNM
PF-TUNA, SCM, KPFM, MFM, EFM and PFM
Tool Overview
Responsible: Peter Blomqvist & Sarah McKibbin
Location: Room Q161, (Level 1 - UVL Lab)
License and Booking Required: Yes
Main application: Surface topography, mechanical & electrical properties
Documentation
Other Links