There are a number of characterisation techniques available in and out of the cleanroom laboratories at Lund Nano Lab.
These include:
- Scanning Electron Microscopes (SEM) for high resolution surface imaging;
- Energy Dispersive X-ray Spectroscopy (EDS) and Electron BackScatter Diffraction (EBSD) for chemical analysis and surface microstructural analysis;
- Atomic Force Microscopy (AFM) for topography, nanomechanical and electrical properties;
- stylus profilometry for quick and easy surface characterisation;
- X-Ray Diffraction (XRD) for characterisation of atomic structure;
- ellipsometry for measuring film thickness and optical properties;
- and several different setups for electrical device characterisation.
Below you find many of the different metrology/characterisation tools available to LNL users.
By clicking on the tools you can access a lot of useful information, such as user manuals, what kind of information one can obtain from the different tools, FAQs, user discussion forums etc.
The metrology/characterisation section is still a work in progress, for suggestions and questions please contact ~ftf-pbo.
Introduction
Welcome... blah blah blah....
Description:
Woollam Ellipsometer - RC2
