Versions Compared

Old Version 33

changes.mady.by.user Peter Blomqvist

Saved on

compared with

New Version Current

changes.mady.by.user Peter Blomqvist

Saved on

Key

  • This line was added.
  • This line was removed.
  • Formatting was changed.

Image RemovedImage Added


Panel
borderColor#BFB8AF
bgColorwhite
titleColorBlack
borderWidth2
titleBGColor#DCE9EE
borderStylesolid
titleTechnical information
  • Bruker Icon Atomic Force Microscope (AFM)

  • Scan modes:

    • Tapping & contact mode

    • PeakForce tapping

    • PeakForce QNM

    • PF-TUNA, SCM, KPFM, MFM, EFM and PFM


Panel
borderColor#BFB8AF
bgColorwhite
titleColorBlack
borderWidth2
titleBGColor#DCE9EE
borderStylesolid
titleTool Overview

Responsible:  Peter Blomqvist &  ~ftf-pbo & Sarah McKibbin

Location: Room Q161, (Level 1 - UVL Lab)Q117/118

License and Booking Required: Yes

Main application: Surface surface topography, mechanical nanomechanical & electrical propertiesmeasurements



Panel
borderColor#BFB8AF
bgColorwhite
titleColorBlack
borderWidth2
titleBGColor#DCE9EE
borderStylesolid
titleDocumentation

User Manuals

Process

Examples - Bruker

AFM

Icon

Staff Documents



Panel
borderColor#BFB8AF
bgColorwhite
titleColorBlack
borderWidth2
titleBGColor#DCE9EE
borderStylesolid
titleOther Links

Safety Information 

View on LIMS

FAQ

User Discussion Forum