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Technical information
  • Bruker D8 Discover X-ray diffration system (XRD)
  • Cu K-alpha radiation (1.5406 Å)
  • Goebel mirror and beam compressor
  • Eulerian cradle with 4" wafer holder
  • PathFinder detector (variable slit and three bounce Ge(220) crystal)
  • Scans: 2T/T, reflectivity, GIXRD, rocking curve, RSM


Tool Overview

Responsible: ~ftf-pbo & Alexander den Ouden

Location: Room Q256, (Level 2)

License and Booking Required: Yes

Main application: crystallographic and surface/interface characterization



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