Versions Compared

Key

  • This line was added.
  • This line was removed.
  • Formatting was changed.

Image RemovedImage Added




Panel
borderColor#BFB8AF
bgColorwhite
titleColorBlack
borderWidth2
titleBGColor#DCE9EE
borderStylesolid
titleTechnical information
  • Bruker D8 Discover X-ray diffration system (XRD)
  • Cu K-alpha radiation (1.5406 Å)
  • Goebel mirror and beam compressor
  • Eulerian cradle with 4" wafer holder
  • PathFinder detector (variable slit and three bounce Ge(220) crystal)
  • Scans: 2T/T, reflectivity, GIXRD, rocking curve, RSM


Panel
borderColor#BFB8AF
bgColorwhite
titleColorBlack
borderWidth2
titleBGColor#DCE9EE
borderStylesolid
titleTool Overview

Responsible: Peter Blomqvist ~ftf-pbo & Alexander den Ouden

Location: Room Q256, (Level 2)Q117/118

License and Booking Required: Yes

Main application: crystallographic and surface/interface characterization


Panel
borderColor#BFB8AF
bgColorwhite
titleColorBlack
borderWidth2
titleBGColor#DCE9EE
borderStylesolid
titleDocumentation

User Manuals

Examples - Bruker D8 Discover

Staff Documents



Panel
borderColor#BFB8AF
bgColorwhite
titleColorBlack
borderWidth2
titleBGColor#DCE9EE
borderStylesolid
titleOther Links

Safety Information 

View on LIMS

FAQ

User Discussion Forum