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titleTechnical information
  • Bruker D8 Discover X-ray diffration system (XRD)
  • Cu K-alpha radiation (1.5406 Å)
  • Trio primary optics
  • Eulerian cradle with 4" wafer holder
  • PathFinder detector (variable slit and Ge(220) analyzer crystal)
  • Scans: 2T/T, reflectivity, GIXRD, rocking curve, RSM

 

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titleTool Overview

Responsible: ~ftf-pbo & Alexander den Ouden

Location: Room Q117/118

License and Booking Required: Yes

Main application: crystallographic and surface/interface characterization


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titleDocumentation

User Manuals

Examples - Bruker D8 Discover

Staff Documents



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titleOther Links

Safety Information 

View on LIMS

FAQ

User Discussion Forum

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Tool Summary

Safety

User Manuals

Process

Staff Documents

     View on LIMS