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titleTechnical information
  • Main application: Metrology surface imagingBruker Icon Atomic Force Microscope (AFM)
  • Scan modes:

    • Tapping & contact mode

    • PeakForce tapping

    • PeakForce QNMPF-TUNA, SCM, KPFM, MFM, EFM and PFM


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titleTool Overview

Responsible:  Peter Blomqvist ~ftf-pbo & Sarah McKibbin

Location: Room Q161, (Level 1 - UVL Lab)Q117/118

License and Booking Required: Yes

Tool Summary

  • Tool Responsible: Peter Blomqvist & Sarah McKibbin

  • Location: LNL, clean room first floor

  • License required: Yes

  • Booking required: Compulsory

  • Tool information:

    • Bruker Icon AFM

    • Scan modes:

      • Tapping & contact mode

      • PeakForce tapping

      • PeakForce QNM

      • PF-TUNA, SCM, KPFM, MFM, EFM and PFM

  • Examples - Bruker AFM

  • FAQ

Safety

User Manuals

Process

Staff Documents

View on LIMS

Main application: surface topography, nanomechanical & electrical measurements



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titleDocumentation

User Manuals

Process

Examples - Bruker Icon

Staff Documents



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titleOther Links

Safety Information 

View on LIMS

FAQ

User Discussion Forum