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titleTechnical information
  • Bruker D8 Discover X-ray diffration system (XRD)
  • Cu K-alpha radiation (1.5406 Å)
  • Goebel mirror and beam compressorTrio primary optics
  • Eulerian cradle with 4" wafer holder
  • PathFinder detector (variable slit and three bounce Ge(220) analyzer crystal)
  • Scans: 2T/T, reflectivity, GIXRD, rocking curve, RSM

 

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titleTool Overview

Responsible: Peter Blomqvist ~ftf-pbo & Alexander den Ouden

Location: Room Q256, (Level 2)Q117/118

License and Booking Required: Yes

Main application: crystallographic and surface/interface characterization


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titleDocumentation

User Manuals

Examples - Bruker

XRD

D8 Discover

Process

Staff Documents



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titleOther Links

Safety Information 

View on LIMS

FAQ

User Discussion Forum