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titleTechnical information
  • Bruker Icon Atomic Force Microscope (AFM)

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Tool Summary

  • Tool Responsible: Peter Blomqvist & Sarah McKibbin

  • Location: LNL, clean room first floor

  • License required: Yes

    • Tool information:

    Bruker Icon AFM

    • Scan modes:

      • Tapping & contact mode

      • PeakForce tapping

      • PeakForce QNM

  • PF-TUNA, SCM, KPFM, MFM, EFM and PFM

  • Examples - Bruker AFM

  • FAQ


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    titleTool Overview

    Responsible: ~ftf-pbo & Sarah McKibbin

    Location: Room Q117/118

    License and Booking Required: Yes

    Main application: surface topography, nanomechanical & electrical measurements



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    titleDocumentation

    User Manuals

    Examples - Bruker Icon

    Staff Documents



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    titleOther Links

    Safety Information 

    View on LIMS

    FAQ

    User Discussion Forum

    Safety

    User Manuals

    Process

    Staff Documents

    View on LIMS