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titleTechnical information
  • Hitachi SU8010 Scanning Electron Microscope (SEM)
  • Cold field emission gun
  • Detectors: In-lens SE & E-T SE, STEM
  • In-situ EBIC & I-V measurements



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titleTool Overview

Responsible: Peter Blomqvist & Alexander den Ouden

Location: Room Q260, (Level 2)

License and Booking Required: Yes


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titleDocumentation

User Manuals

Process

Staff Documents



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titleOther Links

Safety Information 

View on LIMS

FAQ