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titleTechnical information
  • Atomic Force Microscope (AFM)

  • Information about surface topography, mechanical and electrical properties

  • Scan modes:

    • Tapping & contact mode

    • PeakForce tapping

    • PeakForce QNM

    • PF-TUNA, SCM, KPFM, MFM, EFM and PFM


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titleTool Overview

Responsible: Peter Blomqvist & Sarah McKibbin

Location: Room Q161, (Level 1 - UVL Lab)

License and Booking Required: Yes



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titleDocumentation

User Manuals

Process

Examples - Bruker AFM

Staff Documents



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titleOther Links

Safety Information 

View on LIMS

FAQ


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